Characterization of Dental Materials: Time-of-Flight Secondary Ion Mass Spectroscopy, Dynamic Mechanical Analysis, and-Focused Ion Beam

Abstract

Characterization of dental materials is necessary for understanding and identifying the materials composition, structure, and properties. Many characterization techniques and methods are used for surface characterization analysis, evaluation of dynamic moduli, and investigation of the materials surface and subsurface through electrons and ions. Time-of-flight secondary ion mass spectroscopy technique is used for materials surface characterization, analysis of surface molecules and surface-mediated reactions. Dynamic mechanical analysis is a technique that  measures the complex moduli and study the viscoelastic properties of solids. Focused Ion Beam technique is used in imaginging of materials’ surfaces using ion beams,  deposition of materials such as platinum and carbon onto the materials surface, and milling of materials.