Introduction to scanning electron microscopy

Authors

  • walaa salem lecturer assistant

Keywords:

Scanning electron microscope, back scattering, secondary electrons

Abstract

Scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the surface topography and composition of the sample.

Downloads

Published

2022-10-31

Issue

Vol. 1 No. 10 (2022): Biomaterials Journal

Section

Articles

License

Copyright (c) 2022 walaa salem

Creative Commons License

This work is licensed under a Creative Commons Attribution 4.0 International License.

Authors retain copyright and grant the journal right of first publication with the work simultaneously licensed under a Commons Attribution 4.0 International License that allows others to share the work with an acknowledgment of the work's authorship and initial publication in this journal